Analysis of Local Texture across Layers in Electron-Beam Melted (EBM) Ti-6Al- 4V via Electron Backscatter Diffraction (EBSD)
Saller, B, Porter, JR, Van Den Vlekkert, T, Walck, SDVolume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610063191
Date:
July, 2010
File:
PDF, 1.02 MB
english, 2010