Defects Induced by Deep Preamorphization and Their Effects...

Defects Induced by Deep Preamorphization and Their Effects on Metal Oxide Semiconductor Device Characteristics

Miyake, Masayasu
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Volume:
144
Year:
1997
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.1837523
File:
PDF, 1.36 MB
english, 1997
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