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Engineering ReRAM for high-density applications
Calderoni, Alessandro, Sills, Scott, Cardon, Chris, Faraoni, Emiliano, Ramaswamy, NirmalVolume:
147
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2015.04.044
Date:
November, 2015
File:
PDF, 3.07 MB
english, 2015