Topographic Characterization of Cu–Ni NPs @ a-C:H Films by...

Journal of Physical Chemistry B 2015 / 04 Vol. 119; Iss. 17

Topographic Characterization of Cu–Ni NPs @ a-C:H Films by AFM and Multifractal Analysis

Ţălu, Ştefan, Stach, Sebastian, Ghodselahi, Tayebeh, Ghaderi, Atefeh, Solaymani, Shahram, Boochani, Arash, Garczyk, Żaneta
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Volume:
119
Language:
english
Journal:
The Journal of Physical Chemistry B
DOI:
10.1021/acs.jpcb.5b00042
Date:
April, 2015
File:
PDF, 4.48 MB
english, 2015
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