Electron emission from deep traps in hydrogenated amorphous silicon and silicon-germanium: Meyer-Neldel behavior and ionization entropy
Long, Qi, Dinca, Steluta, Schiff, Eric A., Yan, Baojie, Yang, Jeff, Guha, SubhenduVolume:
1321
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/opl.2011.1229
Date:
January, 2011
File:
PDF, 280 KB
english, 2011