Comprehensive Performance Benchmarking of III-V and Si...

IEEE Transactions on Electron Devices 2015 / 3 Vol. 62; Iss. 3

Comprehensive Performance Benchmarking of III-V and Si nMOSFETs (Gate Length = 13 nm) Considering Supply Voltage and OFF-Current

Kim, Raseong, Avci, Uygar E., Young, Ian A.
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2015.2388708
Date:
March, 2015
File:
PDF, 2.56 MB
english, 2015
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