Resistance to cracking of a stretchable semiconductor: Speed of crack propagation for varying energy release rate
Liu, Sheng, Lim, Hee C., Qu, Min, Federici, John F., Thomas, Gordon A., Gleskova, Helena, Wagner, SigurdVolume:
795
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-795-U8.19
Date:
January, 2003
File:
PDF, 269 KB
english, 2003