High Resolution X-Ray Diffraction Study of the Strongly Defected Bi4Sr4CaCu3Ox
Novomlinski, L.A., Narymbetov, B.Zh., Shekhtman, V.Sh., Bush, A.A., Ivanov, S.A., Zhurov, V.V.Volume:
166-169
Year:
1994
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.166-169.783
File:
PDF, 343 KB
1994