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Investigation of the Origin of Micropipe Defect
Okamoto, Atsuto, Sugiyama, Naohiro, Tani, Toshihiko, Kamiya, NobuoVolume:
338-342
Year:
2000
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.338-342.441
File:
PDF, 428 KB
english, 2000