Trap Charge Density at Interfaces of MOCVD...

MRS Proceedings 2005 / 1 Vol. 902

Trap Charge Density at Interfaces of MOCVD Pt(Ir)/PZT/Ir(Ti/SiO2/Si) Structures

Delimova, Lyuba A., Grekhov, I. V., Mashovets, D. V., Shin, Sangmin, Koo, June-Mo, Kim, Suk-Pil, Park, Youngsoo, Afanasjev, V. P., Afanasjev, P. V., Petrov, A. A.
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Volume:
902
Journal:
MRS Proceedings
DOI:
10.1557/PROC-0902-T10-27
Date:
January, 2005
File:
PDF, 337 KB
2005
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