TEM and HRTEM Characterization of TiAl Diffusion Bonds...

Microscopy and Microanalysis 2015 / 02 Vol. 21; Iss. 1

TEM and HRTEM Characterization of TiAl Diffusion Bonds Using Ni/Al Nanolayers

Simões, Sónia, Viana, Filomena, Ramos, Ana S., Vieira, Maria T., Vieira, Manuel F.
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Volume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614013087
Date:
February, 2015
File:
PDF, 1005 KB
english, 2015
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