Image Sensors Based on Thin-film on CMOS Technology: Additional Leakage Currents due to Vertical Integration of the a-Si:H Diodes
Miazza, Clement, Wyrsch, N., Choong, G., Dunand, S., Ballif, C., Shah, A., Blanc, Nicolas, Kaufmann, R., Lustenberger, F., Moraes, D., Despeisse, M., Jarron, P.Volume:
910
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-0910-A17-03
Date:
January, 2006
File:
PDF, 1.02 MB
english, 2006