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TEM investigation of defect reduction and etch pit formation in GaN
Vennemann, Angelika, Dennemarck, Jens, Kröger, Roland, Böttcher, Tim, Hommel, Detlef, Ryder, PeterVolume:
798
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-798-Y5.22
Date:
January, 2003
File:
PDF, 303 KB
english, 2003