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Light elements quantitative x-ray microanalysis of thin samples in STEM. Absorption correction using EELS data
Banchet, V, Michel, J, Jallot, E, Laurent-Maquin, D, Balossier, GVolume:
36
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/36/13/326
Date:
July, 2003
File:
PDF, 241 KB
english, 2003