Impact of SiC Structural Defects on the Degradation...

Materials Science Forum 2003 Vol. 433-436

Impact of SiC Structural Defects on the Degradation Phenomenon of Bipolar SiC Devices

Malhan, Rajesh Kumar, Nakamura, Hiroki, Onda, Shoichi, Nakamura, Daisuke, Hara, Kazukuni
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Volume:
433-436
Year:
2003
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.433-436.917
File:
PDF, 475 KB
2003
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