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Contactless Topographic Analysis of Locally Inhomogeneous Resistivity in SiC and Cd(Zn)Te
Mueller, Stefan, Stibal, Rudolf, Jantz, WolfgangVolume:
600-603
Year:
2009
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.600-603.557
File:
PDF, 443 KB
english, 2009