Extraction of the interface trap density energetic...

Microelectronic Engineering 2015 / 11 Vol. 147

Extraction of the interface trap density energetic distribution in SOI Junctionless Nanowire Transistors

Trevisoli, Renan, Doria, Rodrigo Trevisoli, de Souza, Michelly, Pavanello, Marcelo Antonio
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Volume:
147
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2015.04.040
Date:
November, 2015
File:
PDF, 745 KB
english, 2015
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