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Correlation between Strain and Excess Carrier Lifetime in a 3C-SiC Wafer
Yoshida, Atsushi, Kato, Masashi, Ichimura, MasayaVolume:
717-720
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.717-720.305
Date:
May, 2012
File:
PDF, 626 KB
english, 2012