SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, United States (Saturday 7 February 2015)] High-Power Diode Laser Technology and Applications XIII - Reliability study of high-brightness multiple single emitter diode lasers
Zediker, Mark S., Zhu, Jing, Yang, Thomas, Zhang, Cuipeng, Lang, Chao, Jiang, Xiaochen, Liu, Rui, Gao, Yanyan, Guo, Weirong, Jiang, Yuhua, Liu, Yang, Zhang, Luyan, Chen, LouisaVolume:
9348
Year:
2015
Language:
english
DOI:
10.1117/12.2080434
File:
PDF, 641 KB
english, 2015