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[IEEE 2014 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2014.12.15-2014.12.17)] 2014 IEEE International Electron Devices Meeting - The dynamics of surface donor traps in AlGaN/GaN MISFETs using transient measurements and TCAD modelling
Longobardi, Giorgia, Udrea, Florin, Sque, Stephen, Croon, Jeroen, Hurkx, Fred, Sonsky, JanYear:
2014
Language:
english
DOI:
10.1109/iedm.2014.7047068
File:
PDF, 778 KB
english, 2014