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Electrical Modeling and Characterization of Shield Differential Through-Silicon Vias
Lu, Qijun, Zhu, Zhangming, Yang, Yintang, Ding, RuixueVolume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2015.2410312
Date:
May, 2015
File:
PDF, 2.27 MB
english, 2015