New Opportunities in X-Ray Texture Analysis of two Phase...

New Opportunities in X-Ray Texture Analysis of two Phase Ti-Aluminides by Application of a Proportional Scintillation Detector and the Component Method to ODF Reproduction

Bermig, G., Tobisch, J., Richter, K., Helming, Kurt
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Volume:
133-136
Year:
1993
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.133-136.163
File:
PDF, 316 KB
1993
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