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[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - CSST: Preventing distribution of unlicensed and rejected ICs by untrusted foundry and assembly
Rahman, Md. Tauhidur, Forte, Domenic, Shi, Quihang, Contreras, Gustavo K., Tehranipoor, MohammadYear:
2014
Language:
english
DOI:
10.1109/dft.2014.6962096
File:
PDF, 391 KB
english, 2014