Correlation between Defects and Electrical Properties of...

Materials Science Forum 2003 Vol. 433-436

Correlation between Defects and Electrical Properties of 4H-SiC Based Schottky Diodes

Scaltrito, Luciano, Porro, Samuele, Giorgis, Fabrizio, Mandracci, P., Cocuzza, M., Pirri, C. Fabrizio, Ricciardi, C., Ferrero, Sergio, Richieri, G., Sgorlon, C., Merlin, Luigi, Cavallini, Anna, Castal
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Volume:
433-436
Year:
2003
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.433-436.455
File:
PDF, 316 KB
english, 2003
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