The Use of Low Energy Positrons to Probe Defects in...

Materials Science Forum 1995 Vol. 175-178

The Use of Low Energy Positrons to Probe Defects in Langmuir-Blodgett Films

Smith, F.A., Naidu, Seetala V., Hill, M.A., Tucker, C., Oriel, J.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
175-178
Year:
1995
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.175-178.533
File:
PDF, 286 KB
1995
Conversion to is in progress
Conversion to is failed