Projected range and straggling measurements of low energy...

Radiation Effects 1983 / 01 Vol. 70; Iss. 1-4

Projected range and straggling measurements of low energy nitrogen in silicon

Malherbe, J. B.
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Volume:
70
Language:
english
Journal:
Radiation Effects
DOI:
10.1080/00337578308219221
Date:
January, 1983
File:
PDF, 763 KB
english, 1983
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