Low VDD and body bias conditions for testing bridge defects...

Microelectronics Journal 2015 / 05 Vol. 46; Iss. 5

Low VDD and body bias conditions for testing bridge defects in the presence of process variations

Villacorta, Hector, Garcia-Gervacio, Jose, Segura, Jaume, Champac, Victor
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Volume:
46
Language:
english
Journal:
Microelectronics Journal
DOI:
10.1016/j.mejo.2015.02.006
Date:
May, 2015
File:
PDF, 541 KB
english, 2015
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