Correlated extended X-ray absorption fine structure and transmission electron microscopy studies the microstructure of low friction Ti–C–N films
Liu, D.G., Pan, Y.J., Bai, W.Q., Tu, J.P.Volume:
266
Language:
english
Journal:
Surface and Coatings Technology
DOI:
10.1016/j.surfcoat.2015.02.022
Date:
March, 2015
File:
PDF, 1.18 MB
english, 2015