Microscopic C-V measurements of SOI wafers by scanning...

Microscopic C-V measurements of SOI wafers by scanning capacitance microscopy

Ishida, T., Yoshida, H., Kishino, S.
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Volume:
27
Language:
english
Journal:
The European Physical Journal Applied Physics
DOI:
10.1051/epjap:2004134
Date:
July, 2004
File:
PDF, 784 KB
english, 2004
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