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The significant effect of film thickness on the properties of chalcopyrite thin absorbing films deposited by RF magnetron sputtering
Mishra, P.K., Prasad, J.N., Dave, V., Chandra, R., Choudhary, A.K.Volume:
34
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2015.02.047
Date:
June, 2015
File:
PDF, 2.05 MB
english, 2015