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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] X-Ray Nanoimaging: Instruments and Methods - Full-field x-ray nano-imaging at SSRF
Lai, Barry, Deng, Biao, Ren, Yuqi, Wang, Yudan, Du, Guohao, Xie, Honglan, Xiao, TiqiaoVolume:
8851
Year:
2013
Language:
english
DOI:
10.1117/12.2035589
File:
PDF, 455 KB
english, 2013