![](/img/cover-not-exists.png)
Verification of Near-Interface Traps Models by Electrical Measurements on 4H-SiC n-Channel Mosfets
Uhnevionak, Viktoryia, Strenger, Christian, Burenkov, Alex, Mortet, Vincent, Bedel-Pereira, Elena, Cristiano, Fuccio, Bauer, Anton, Pichler, PeterVolume:
740-742
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.740-742.533
Date:
January, 2013
File:
PDF, 837 KB
english, 2013