In-Field Test for Permanent Faults in FIFO Buffers of NoC...

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IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2015

In-Field Test for Permanent Faults in FIFO Buffers of NoC Routers

Ghoshal, Bibhas, Manna, Kanchan, Chattopadhyay, Santanu, Sengupta, Indranil
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Year:
2015
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2015.2393714
File:
PDF, 596 KB
english, 2015
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