Design and analyze of transient-induced latch-up in RS485...

Microelectronics Reliability 2015 / 02 Vol. 55; Iss. 3-4

Design and analyze of transient-induced latch-up in RS485 transceiver with on-chip TVS

Jiang, Qi, Yuan, Huihui, Wang, Yang, Jin, Xiangliang
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Volume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.12.012
Date:
February, 2015
File:
PDF, 6.35 MB
english, 2015
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