Failure analysis on reflector blackening between lead frame electrodes in LEDs under WHTOL test
Zhang, Lei, Zhu, Yejun, Chen, Haibin, Leung, Karina, Wu, Yeqing, Wu, JingshenVolume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.01.004
Date:
April, 2015
File:
PDF, 4.48 MB
english, 2015