In-situ measurements of the secondary electron yield in an...

In-situ measurements of the secondary electron yield in an accelerator environment: Instrumentation and methods

Hartung, W.H., Asner, D.M., Conway, J.V., Dennett, C.A., Greenwald, S., Kim, J.-S., Li, Y., Moore, T.P., Omanovic, V., Palmer, M.A., Strohman, C.R.
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Volume:
783
Language:
english
Journal:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
DOI:
10.1016/j.nima.2015.01.092
Date:
May, 2015
File:
PDF, 2.09 MB
english, 2015
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