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Silicon-Carbon Source and Drain Stressors: Carbon Profile...

Silicon-Carbon Source and Drain Stressors: Carbon Profile Design by Ion Implantation

Zhou, Qian, Koh, Shao-Ming, Tong, Yi, Henry, Todd, Erokhin, Yuri, Yeo, Yee-Chia
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Volume:
159
Year:
2012
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/2.072204jes
File:
PDF, 656 KB
english, 2012
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