Causes and consequences of the stochastic aspect of filamentary RRAM
Degraeve, R., Fantini, A., Raghavan, N., Goux, L., Clima, S., Govoreanu, B., Belmonte, A., Linten, D., Jurczak, M.Volume:
147
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2015.04.025
Date:
November, 2015
File:
PDF, 1.60 MB
english, 2015