In-Situ Analysis of Microstress and Texture Development during Tensile Deformation of MMCs at Room Temperature and at Elevated Temperatures Using Synchrotron Radiation
Pyzalla, A.R., Reetz, Bjoern, Wegener, J., Jacques, Alain, Ferry, Olivier, Feiereisen, J.-P., Buslaps, ThomasVolume:
404-407
Year:
2002
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.404-407.535
File:
PDF, 467 KB
2002