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Threshold voltage drift in phase change memories: scaling and modeling
Ciocchini, N., Cassinerio, M., Fugazza, D., Ielmini, D.Volume:
1431
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/opl.2012.1315
Date:
January, 2012
File:
PDF, 604 KB
english, 2012