EMI Measurements, Modeling, and Reduction of 32-Bit...

IEEE Transactions on Electromagnetic Compatibility 2014 / 10 Vol. 56; Iss. 5

EMI Measurements, Modeling, and Reduction of 32-Bit High-Performance Microcontrollers

Leca, Jean Pierre, Froidevaux, Nicolas, Dupre, Philippe, Jacquemod, Gilles, Braquet, Henri
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Volume:
56
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/temc.2014.2304744
Date:
October, 2014
File:
PDF, 1.32 MB
english, 2014
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