Cross-Sectional Micro-Raman Spectroscopy: A Tool for...

Materials Science Forum 1998 Vol. 264-268

Cross-Sectional Micro-Raman Spectroscopy: A Tool for Structural Investigations of Thin Polytypic SiC Layers

Werninghaus, T., Zahn, D.R.T., Yankov, R.A., Mücklich, A., Pezoldt, Jörg
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Volume:
264-268
Year:
1998
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.264-268.661
File:
PDF, 340 KB
1998
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