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Using the Focused Ion Beam to Perform Serial Sectioning of Micron-Sized Particles for Coordinated Nanoscale Analysis
Bassim, Nabil D., De Gregorio, Bradley T., Stroud, Rhonda M.Volume:
1089
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-1089-Y04-05
Date:
January, 2008
File:
PDF, 3.62 MB
english, 2008