Defect Formation in Heavily As-Doped Cz Si

Rouvimov, S., Kuytt, R., Kearns, J., Todt, V., Orschel, B., Siriwardane, H., Buczkowski, A., Shul'pina, I., Rozgonyi, George A.

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Volume:

95-96

Year:

2004

Journal:

Solid State Phenomena

DOI:

10.4028/www.scientific.net/SSP.95-96.17

File:

PDF, 457 KB

2004

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