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Shallow Angle X-Ray Diffraction from In-Situ Silica: Titania Sol-Gel Thin Films
Rigden, J.S., Newport, R.J., Smith, M.E., Dirken, P.J.Volume:
228-231
Year:
1996
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.228-231.525
File:
PDF, 428 KB
1996