![](/img/cover-not-exists.png)
Probing Carrier Depletions on Grain Boundaries in Polycrystalline Si Thin Films by Scanning Capacitance Microscopy
Jiang, Chunsheng, Moutinho, H.R., To, B., Dippo, P., Romero, M.J., Al-Jassim, M.M.Volume:
1066
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-1066-A04-02
Date:
January, 2008
File:
PDF, 1.44 MB
english, 2008