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Influence of Cobalt Contamination in the Measurement of Diffusion Length of Silicon Wafers
Pic, Nicolas, Danel, Adrien, Polignano, Maria Luisa, Salvà, Gianluca, Sardo, Massimo, Rey, StéphaneVolume:
95-96
Year:
2004
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.95-96.373
File:
PDF, 287 KB
english, 2004