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High Resolution Electron Microscopy of Misfit Dislocations at Metal-Oxide Interfaces
Groen, H.B., Kooi, B.J., Vellinga, W.P., de Hosson, Jeff Th.M.Volume:
294-296
Year:
1999
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.294-296.107
File:
PDF, 433 KB
1999