Effect of Nonannealed Ohmic-Recess Structure on Temperature-Dependent Characteristics of Metamorphic High-Electron-Mobility Transistors
Chen, Li-Yang, Cheng, Shiou-Ying, Chu, Kuei-Yi, Tsai, Tsung-Han, Chen, Tzu-Pin, Hung, Ching-Wen, Liu, Wen-ChauVolume:
155
Year:
2008
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.2905813
File:
PDF, 219 KB
english, 2008