Effects of Oxidation and Annealing Temperature on Grain Boundary Properties in Polycrystalline Silicon Probed Using Nanometre-Scale Point-Contact Devices
Kamiya, Toshio, Furuta, Yoshikazu, Tan, Yong-Tsong, Durrani, Z.A.K., Mizuta, Hiroshi, Ahmed, HaroonVolume:
93
Year:
2003
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.93.345
File:
PDF, 1.03 MB
english, 2003